Conference paperParasitic Resistance Reduction for Aggressively Scaled Stacked Nanosheet TransistorsSu-Chen Fan, Ruilong Xie, et al.IITC 2020
PaperIntrinsic effective mobility extraction with extremely scaled gate dielectricsZuoguang Liu, Dechao Guo, et al.Applied Physics Letters
Conference paperProcess optimizations for NBTI/PBTI for future replacement metal gate technologiesBarry P. Linder, A. Dasgupta, et al.IRPS 2016
Conference paperSeparation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFETMiaomiao Wang, Zuoguang Liu, et al.IRPS 2015
