Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
We report the pressure-dependent optical absorption in the fundamental edge region of amorphous silicon prepared by sputtering and glow discharge methods. For pressures up to 20 kbar we find a negative pressure coefficient of about 1 × 10-6 eV/bar for the isoabsorption energies. In a higher range of pressure, starting with pressures of about 50 kbar, we observed irreversible red shifts in the absorption curves. © 1977 The American Physical Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Hiroshi Ito, Reinhold Schwalm
JES
E. Burstein
Ferroelectrics
Peter J. Price
Surface Science