Center for Software Engineering
ODC Outside IBM
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Orthogonal Defect Classification (ODC) was formulated in IBM Research nearly a decade ago. There have been numerous papers published by authors from IBM Research on the underlying concepts and applications within IBM. Over the past few years the use of ODC has grown in the industry. Researchers and practitioners from other companies and academic institutions have published many articles related to ODC. The following is an incomplete list of such contributions.
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Last revised on February 1, 2002.
Stephen H. Kan, "Metrics and Models in Software Quality Engineering", Published December 1994 by Addison Wesley, ISBN: 0-201-63339-6.
John D. McGregor and David A. Sykes, "A Practical Guide to Testing Object-Oriented Software", Published 2001 by Addison-Wesley, Pearson Education, ISBN: 0-201-32564-0.
J. Silberman, Robotics Institute, Carnegie Mellon University, "Robot Orthogonal Defect Classification Towards an In-Process Measurement System for Mobile Robot Development, 1998. Tech. Report CMU-RI-TR-99-05.
Jorgen Christmansson, Chalmers University of Technology, Goteborg, Sweden, "An Exploration of Models for Software Faults and Errors: A Journey Through Field Data and Injection Experiments", Department of Computer Engineering, 1998. Technical Report No. 327.
Yuri Chernak, "A Statistical Approach to the Inspection Checklist Formal Synthesis and Improvement", IEEE Transactions on Software Engineering, December 1996 (Vol. 22, No. 12), pp. 866-874 .
Norman Bridge, Motorola Corporate Software Center, Schaumburg, IL and Corinne Miller, Motorola GSN Product Division, Arlington Heights, IL, "Orthogonal Defect Classification Using Defect Data to Improve Software Development", Software Quality, No. 3, 1997-98
Shari Lawrence Pfleeger, Systems/Software, Inc., Washington, DC, "Measuring Software Quality to Support Testing ", 11th International Software Quality Week The Sheraton Palace San Francisco, California 26-29 May 29, 1998 .
Khaled El Emam and Isabella Wierczorek, "The Repeatability of Code Defect Classifications", Proceedings of the International Symposium on Software Reliability Engineering (ISSRE), Paderborn, Germany, November 4-7, 1998.
Charles Schultz, Motorola, "Orthogonal Defect Classification-Based Test Planning and Development", Proceedings of International Conference on Applications of Software Measurement (ASM), San Jose, CA., February 15-19, 1999.
Thomas Messmore, IBM Tucson, "Process Metamorphosis in IBM's Storage Systems Division", Proceedings of International Conference on Applications of Software Measurement (ASM), San Jose, CA., February 15-19, 1999.
Siddhartha Dalal, Michael Hamada, Paul Matthews, Gardner Patton, "Using Defect Patterns to Uncover Opportunities for Improvement", Proceedings of International Conference on Applications of Software Measurement (ASM), San Jose, CA., February 15-19, 1999.
Rob Bleck, Barbara Hirsh, Corinne Miller, Paul Norkus, Steve Wood, Motorola, "The Orthogonal Defect Classification Methodology as Employed in the Motorola GSM Organization", C-SPIN (Chicago Software Process Improvement Network) May 6, 1999.
Barbara Hirsh, Robert Bleck, and Steven Wood, Motorola, "A Comprehensive Defect Prevention Program Using the ODC Methodology", Proceedings, FastAbstracts and Industrial Practices, The 10th International Symposium on Software Reliability Engineering (ISSRE), Boca Raton, FL, November 1-4, 1999.
N.B. Sreenivasan, Lucent Technologies, "Experiences with Orthogonal Defect Classification Technique at Lucent Technologies", Proceedings, FastAbstracts and Industrial Practices, The 10th International Symposium on Software Reliability Engineering (ISSRE), Boca Raton, FL, November 1-4, 1999
Barbara Hirsh, Motorola, "Our Experience Using Orthogonal Defect Classification", Proceedings of International Conference on Applications of Software Measurement (ASM), San Jose, CA., March 6-10, 2000.
Jon Huber, Hewlett Packard, "A Comparison of IBM's Orthogonal Defect Classification to Hewlett Packard's Defect Origins, Types, and Modes", Proceedings of International Conference on Applications of Software Measurement (ASM), San Jose, CA., March 6-10, 2000.
Robert Mullen, "Orthogonal Defect Classification at Cisco Systems", Proceedings of Industry Day, The International Symposium on Software Reliability Enginnering and the International Conference on Software Maintenance, San Jose, CA, October 11, 2000. (How Cisco Systems is implementing ODC.)
Manjula Madan, Philips Software Centre, Bangalore, "Defect Reduction Using Orthogonal Defect Classification Methodology", Proceedings of Quality Week 2001, San Francisco, CA, May 29-June 1, 2001.
David N. Card, Fellow, Software Productivity Consortium, "Learning from our Mistakes with Defect Causal Analysis", Southern California Software Process Improvement Network - SPIN, April 2001.
J. Silberman, J. Bares and P. Santhanam,“RODC, a Measurement System for Mobile Robot Development”, Proceedings of the International Symposium on Robotics and Automation, Saltillo, Coahuila, Mexico, December 12-14, 1998.
Michael Fredericks and Victor Basili, University of Maryland, College Park, Maryland, "Using Defect Tracking and Analysis to Improve Software Quality", A DACS State-of-the-Art Report (Data & Analysis Center for Software), 14 November 1998.
http://www.ices.cmu.edu/rapidcompsyllabus.html
Paradigm Shift in Computing - Spring 2001; Carnegie Mellon University, NJ
This is a project-oriented course, which will deal with all four aspects
of project development: the application, the artifact, the computer-aided design
environment, and the physical prototyping facilities. The class, in conjunction
with the instructors and researchers from General Motors, will develop specifications
for a new car-driver interface. The class will be divided into groups. Some
groups will specify, design, and implement various car-driver scenarios. Other
groups will specify, design, and implement services that are used by multiple
applications. Still other groups will incorporate new methods of perceiving
the state of the driver. The goal is to produce a hardware/software prototype
of these scenarios and to build them into a GM vehicle. We will also monitor
our progress in the design process by capturing our design escapes (errors)
with Orthogonal Defect Classification (ODC). Upon completion of this course
the student will be able to: generate systems specifications from a perceived
need; partition functionality between hardware and software; produce interface
specifications for a system composed of numerous subsystems; use computer-aided
development tools; fabricate, integrate, and debug a hardware/software system;
and evaluate the system in the context of an end user application.
http://attila.stevens-tech.edu/~lbernste/cs460info.html
Software Engineering Theory and Practice - Fall 2000; Stevens Institute of
Technology, Hoboken, NJ
The evolution of the software life cycle culminating in the Win-Win Spiral model
is taught. The Spiral model is applied in the longer project. Requirements development
and validation use prototyping and analysis techniques. Software design topics
include risk identification and analysis, design for reliability and testability.
The merits of top-down and bottom up design are compared. Code reviews and inspections
are used with static quality assessment techniques. Orthogonal defect classification
is introduced. Testing approaches including Software Fault Injection, Stress
and Reliability testing are included. Discussions of these approaches in terms
of defect and failure analysis gives the student a background in why systems
fail and how to avoid failure using risk containment techniques. Rapid prototyping,
top down, bottom up; successive refinement, extreme programming, design constraints
and data abstraction are presented.
http://www.cs.queensu.ca/home/shepard/599outline.html
Computer System/Software Verification and Validation; Queen's University, Kingston,
Ontario, Canada
Week 6: Orthogonal Defect Classification. Overview of Testing. Lists of
test tools. Testing Maturity Model. R. Chillarege, et al., "Orthogonal Defect
Classification - A Concept for In-Process Management", IEEE TSE, v. 18 n.11,
Nov 92, pp. 943-956 Overview of testing: Professor’s notes. Test tools from
a number of companies are available for evaluation. Examples include ParaSoft’s
Codewizard source code analysis tool, and User Interface testing tools such
as Xrunner Also see letter describing problems with such tools, pp. 12,14, IEEE
Software Nov/Dec 97.
