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Welcome to the website of the
Nanoscale science and technology group at the IBM T. J. Watson Research Center, Yorktown Heights, New York.
Our group uses scanning tunneling
microscopy (STM) and atomic force microscopy (AFM) as structural
probes, and, along with electron beam lithography, as tools for the
modification of materials at the atomic and nanometer scales and
the fabrication and study of nano-electronic devices.
Currenly, we are investigating carbon nanotubes, nanolithography and
silicon nanoelectronics
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