Publications

 

2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003

2012

  1. Micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy,
    A. Sebastian, N. Shamsudhin, H. Rothuizen, U. Drechsler, W. W. Koalmans, H. Bhaskaran, H. J. Quenzer, B. Wagner and M. Despont,
    Review of Scientific Instruments 83, 096107, 2012.
  2. Optimal scan trajectories for high speed scanning probe microscopy,
    T. Tuma, J. Lygeros, A. Sebastian, A. Pantazi,
    Proc. American Control Conf., Montreal, 2012.
  3. Micro-cantilever design and modeling framework for quantitative multi-frequency AFM,
    N. Shamsudhin, H. Rothuizen, M. Despont, J. Lygeros, A. Sebastian,
    IEEE Nanotechnology Conf., Birmingham, pp. 1–5, 2012.
  4. A dual-stage nanopositioning approach to high-speed scanning probe microscopy,
    T. Tuma, W. Haeberle, H. Rothuizen, J. Lygeros, A. Pantazi and A. Sebastian,
    IEEE Conf. on Decision and Control, 2012.
  5. Nanopositioning With Impulsive State Multiplication: A Hybrid Control Approach,
    T. Tuma, A. Pantazi, J. Lygeros, A. Sebastian,
    IEEE Transactions on Control Systems Technology, p. 99, 2012.
  6. High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories,
    T. Tuma, J. Lygeros, V. Kartik, A. Sebastian, A. Pantazi,
    Nanotechnology 23(18), 185501, IOP Publishing, 2012.
  7. Nanopositioning With Multiple Sensors: A Case Study in Data Storage,
    A. Sebastian, A. Pantazi,
    IEEE Transactions on Control Systems Technology 20(2), 382-394, 2012.
  8. Tracking of triangular references using signal transformation for control of a novel AFM scanner stage,
    A. Bazaei, Y. K. Yong, S. O. R. Moheimani, and A. Sebastian,
    Control Systems Technology, IEEE Transactions on 20(2), 453–464, Mar. 2012.
  9. Comparison of two non-linear control approaches to fast nanopositioning: impulsive control and signal transformation,
    Tomas Tuma, Angeliki Pantazi, John Lygeros and Abu Sebastian,
    Mechatronics, 2012.
  10. High-bandwidth nanopositioner with magnetoresistance based position sensing,
    V. Kartik, A. Sebastian, T. Tuma, A. Pantazi, H. Pozidis, D.R. Sahoo,
    Mechatronics 22(3), 295-301, Elsevier, 2012.
  11. Editorial: Special issue on "Mechatronic systems for micro- and nanoscale applications",
    G. Schitter, A. Sebastian,
    Mechatronics, Elsevier, 2012.

2011

  1. Platinum silicide probes: A novel approach to manufacture highly conductive AFM probes with small radii and high wear resistance,
    O. Krause, A. Sebastian and M. Despont,
    International scanning probe microscopy meeting (ISPM), Munich, Germany, 2011.
  2. Electrical transport and resistance switching in amorphous carbon at the nanometer scale,
    A. Sebastian, A. Pauza, C. Rossel, R. M. Shelby, A. F. Rodriguez, H. Pozidis and E. Eleftheriou,
    Swiss Physical Society annual meeting, Lausanne, Switzerland, 2011.
  3. High-Bandwidth Intermittent-Contact Mode Scanning Probe Microscopy Using Electrostatically-Actuated Microcantilevers,
    D. R. Sahoo, W. Haeberle, A. Sebastian, H. Pozidis and E. Eleftheriou,
    Springer Lecture Notes in Control and Information Sciences 413, 119–135, 2011.
  4. Systems and Control Approach to Electro-Thermal Sensing,
    A. Sebastian,
    Control Technologies for Emerging Micro and Nanoscale Systems, 137–152, 2011.
  5. An Analysis of Signal Transformation Approach to Triangular Waveform Tracking,
    A. Bazaei, S. O. R. Moheimani and A. Sebastian,
    Automatica 47(4), 838–847, 2011.
  6. Nanopositioning with multiple sensors: MISO control and inherent sensor fusion,
    A. Sebastian, A. Pantazi,
    World Congress, pp. 2012–2017, 2011.
  7. Force modulation for enhanced nanoscale electrical sensing,
    W. W. Koelmans, A. Sebastian, L. Abelmann, M. Despont, H. Pozidis,
    Nanotechnology 22(35), 355706, IOP Publishing, 2011.
  8. Fabrication of conducting AFM cantilevers with AlN-based piezoelectric actuators,
    H. J. Quenzer, U. Drechsler, A. Sebastian, S. Marauska, B. Wagner, M. Despont,
    Procedia Engineering 25, 665–668, Elsevier, 2011.
  9. Ultra high density scanning electrical probe phase-change memory for archival storage,
    L. Wang, C.D. Wright, P. Shah, M.M. Aziz, A. Sebastian, H. Pozidis, A. Pauza,
    Japanese Journal of Applied Physics 50(9), 1–2, 2011.
  10. High-speed spiral nanopositioning,
    A. Kotsopoulos, A. Pantazi, A. Sebastian, T. Antonakopoulos,
    Proceedings of IFAC World Congress, 2011.
  11. Scanning probe microscopy based on magnetoresistive sensing,
    D.R. Sahoo, A. Sebastian, W. Haeberle, H. Pozidis, E. Eleftheriou,
    Nanotechnology 22, 145501, IOP Publishing, 2011.
  12. Resistance switching at the nanometre scale in amorphous carbon,
    A. Sebastian, A. Pauza, C. Rossel, R. M. Shelby, A. F. Rodriguez, H. Pozidis, E. Eleftheriou,
    New Journal of Physics 13, 013020, IOP Publishing, 2011.
  13. Impulsive control for fast nanopositioning,
    T. Tuma, A. Sebastian, W. Haeberle, J. Lygeros, A. Pantazi,
    Nanotechnology 22(13), 135501, IOP Publishing, 2011.
  14. Impulsive control for nanopositioning: stability and performance,
    T. Tuma, A. Pantazi, J. Lygeros, A. Sebastian,
    Proceedings of the 14th International Conference on Hybrid Systems: Computation and Control, pp. 173–180, 2011.

2010

  1. Tracking of high frequency piecewise affine signals using impulsive control,
    T. Tuma, A. Pantazi, J. Lygeros and A. Sebastian,
    Proceedings of the IFAC Symposium on Mechatronics, Boston, USA, 2010.
  2. Write strategies for multiterabit per square inch scanned-probe phase-change memories,
    C. D. Wright, P. Shah, L. Wang, M. M. Aziz, A. Sebastian and H. Pozidis,
    Applied Physics Letters 97, 173104, 2010.
  3. Real-Time Models of Electrostatically Actuated Cantilever Probes With Integrated Thermal Sensor for Nanoscale Interrogation,
    P. Agarwal, D. R. Sahoo, A. Sebastian, H. Pozidis, M. V. Salapaka,
    Journal of Microelectromechanical Systems 19(1), 83–98, IEEE, 2010.
  4. Scanning thermal microscopy for fast multiscale imaging and manipulation,
    R. J. Cannara, A. Sebastian, B. Gotsmann, H. Rothuizen,
    IEEE Transactions on Nanotechnology 9(6), 745–753, 2010.
  5. Force modulation for improved conductive-mode atomic force microscopy,
    W.W. Koelmans, A. Sebastian, M. Despont, H. Pozidis,
    10th IEEE Conference on Nanotechnology (IEEE-NANO), pp. 875–878, 2010.
  6. Channel modeling and signal processing for probe storage channels,
    H. Pozidis, G. Cherubini, A. Pantazi, A. Sebastian, E. Eleftheriou,
    IEEE Journal on Selected Areas in Communications 28(2), 143–157, 2010.
  7. Scanning Probe Microscopy Using Higher-Mode Electrostatically-Actuated Microcantilevers,
    D. R. Sahoo, V. Kartik, A. Sebastian, H. Pozidis,
    Proceedings of the IFAC Symposium on Mechatronics, Boston, USA, pp. 212–219, 2010.
  8. Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon,
    H. Bhaskaran, B. Gotsmann, A. Sebastian, U. Drechsler, M. A. Lantz, M. Despont, P. Jaroenapibal, R. W. Carpick, Y. Chen, K. Sridharan,
    Nature Nanotechnology 5(3), 181–185, 2010.
  9. High-throughput intermittent-contact scanning probe microscopy,
    D. R. Sahoo, W. Haeberle, A. Sebastian, H. Pozidis, E. Eleftheriou,
    Nanotechnology 21, 075701, IOP Publishing, 2010.
  10. The Millipede–a nanotechnology-based AFM data-storage system,
    G. K. Binnig, G. Cherubini, M. Despont, U. T. Dürig, E. Eleftheriou, H. Pozidis, P. Vettiger,
    Springer Handbook of Nanotechnology, 1601–1632, 2010.

2009

  1. Signal transformation approach to fast nanopositioning,
    A. Sebastian and S. O. Reza Moheimani,
    Review of Scientific Instruments 80, 076101, 2009.
  2. Novel scanning probe concepts for nanoscale electrical characterization,
    A. Sebastian, H. Bhaskaran, A. Pauza, M. Despont, H. Pozidis.
    9th IEEE Conference on Nanotechnology IEEE-NANO, pp. 72–74, 2009.
  3. High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensor,
    D. R  Sahoo, W. Haberle, P. Bachtold, A. Sebastian, H. Pozidis, E. Eleftheriou,
    American Control Conference ACC'09, pp. 2278–2283, 2009.
  4. Multiscale thermoelectric imaging for fast metrology and manipulation,
    R. J. Cannara, A. Sebastian, B. Gotsmann, H. Rothuizen,
    9th IEEE Conference on Nanotechnology IEEE-NANO, pp. 781–783, 2009.
  5. Recent advances in conduction mode scanning probes for phase change probe storage applications,
    H. Bhaskaran, A. Sebastian, A. Pauza, L. Wang, C.D. Wright, M. Despont, H. Pozidis, E. Eleftheriou,
    Proc. European Symp. on Phase Change and Ovonic Science (E\PCOS 2009).
  6. Encapsulated tips for reliable nanoscale conduction in scanning probe technologies,
    H. Bhaskaran, A. Sebastian, U. Drechsler, M. Despont,
    Nanotechnology 20(10), 105701, IOP Publishing, 2009.
  7. Magnetoresistive sensor based scanning probe microscopy,
    D. R. Sahoo, A. Sebastian, W. Haberle, H. Pozidis, E. Eleftheriou,
    9th IEEE Conference on Nanotechnology IEEE-NANO, pp. 862–865, 2009.
  8. Feedback enhanced thermo-electric topography sensing,
    A. Sebastian, D. Wiesmann, P. Baechtold, H. Rothuizen, M. Despont, U. Drechsler.
    Int'l Conference on Solid-State Sensors, Actuators and Microsystems, pp. 1963–1966, 2009.
  9. Nanoscale phase transformation in GeSbTe using encapsulated scanning probes and retraction force microscopy,
    H. Bhaskaran, A. Sebastian, A. Pauza, H. Pozidis, M. Despont,
    Review of Scientific Instruments 80, 083701, 2009.
  10. Design of power-optimized thermal cantilevers for scanning probe topography sensing,
    H. Rothuizen, M. Despont, U. Drechsler, C. Hagleitner, A. Sebastian, D. Wiesmann,
    IEEE 22nd International Conference on Micro Electro Mechanical Systems "MEMS", pp. 603–606, 2009.
  11. Multilevel Phase Change Memory Modeling and Experimental Characterization,
    A. Pantazi, A. Sebastian, N. Papandreou, MJ Breitwisch, C. Lam, H. Pozidis, E. Eleftheriou,
    Proc. European Phase Change and Ovonics Symposium, 2009.
  12. Nanoscale PtSi tips for conducting probe technologies,
    H. Bhaskaran, A. Sebastian, M. Despont,
    IEEE Transactions on Nanotechnology 8(1), 128–131, 2009.
  13. Performance evaluation of the probe storage channel,
    T. P. Parnell, H. Pozidis, O.V. Zaboronski,
    Global Telecommunications Conference, pp. 1–6, 2009.
  14. Probabilistic data detection for probe-based storage channels in the presence of jitter,
    H. Pozidis, G. Cherubini,
    IEEE International Conference on Communications, pp. 1–6, 2009.

2008

  1. Track-Follow Control for High-Density Probe-Based Storage Devices,
    A. Pantazi, A. Sebastian, H. Pozidis, E. Eleftheriou,
    World Congress, pp. 9236–9241, 2008.
  2. Dynamics of Integrated Silicon Micro-Heaters,
    A. Sebastian, D. Wiesmann,
    World Congress, pp. 10474–10479, 2008.
  3. Modeling and experimental identification of silicon microheater dynamics: A systems approach,
    A. Sebastian, D. Wiesmann,
    IEEE Journal of Microelectromechanical Systems 17(4), 911–920, 2008.
  4. Achieving subnanometer precision in a MEMS-based storage device during self-servo write process,
    A. Sebastian, A. Pantazi, S.O.R. Moheimani, H. Pozidis, E. Eleftheriou,
    IEEE Transactions on Nanotechnology 7(5), 586–595, 2008.
  5. A self servo writing scheme for a MEMS storage device with sub-nanometer precision,
    A. Sebastian, A. Pantazi, S.O.R. Moheimani, H. Pozidis, E. Eleftheriou,
    Proc. IFAC World Congress, Seoul, Korea, pp. 9241–9247, 2008.
  6. Modeling and identification of the dynamics of electrostatically actuated microcantilever with integrated thermal sensor,
    P. Agarwal, D. Sahoo, A. Sebastian, H. Pozidis, M.V. Salapaka,
    47th IEEE Conference on Decision and Control CDC 2008, pp. 2624–2630, 2008.
  7. On intermittent-contact mode sensing using electrostatically-actuated micro-cantilevers with integrated thermal sensors,
    DR Sahoo, W. Haberle, P. Bachtold, A. Sebastian, H. Pozidis, E. Eleftheriou,
    American Control Conference, pp. 2034–2039, 2008.
  8. Scanning probe-based phase-change terabyte memories,
    C. D. Wright, M. Armand, M. M. Aziz, H. Bhaskaran, B. C. Choo, C. Davies, M. Despont, S. Gidon,  M. Klein, O. Lemonnier,
    Proc. European Phase Change and Ovonics Symposium, 2008.
  9. Nanopositioning for probe-based data storage [Applications of Control],
    A. Sebastian, A. Pantazi, H. Pozidis, E. Eleftheriou,
    IEEEControl Systems Magazine 28(4), 26–35, 2008.
  10. Probe-based ultrahigh-density storage technology,
    A. Pantazi, A. Sebastian, T. A. Antonakopoulos, P. Bachtold, A. R. Bonaccio, J. Bonan, G. Cherubini, M. Despont, R. A. DiPietro, U. Drechsler, U. Durig, B. Gotsmann, W. Haberle, C. Hagleitner, J. L. Hedrick, D. Jubin, A. Knoll, M. A. Lantz, J. Pentarakis,
    IBM Journal of Research and Development 52(4.5), 493–511, 2008.
  11. Forward message passing detector for probe storage,
    T. Parnell, H. Pozidis, O.V. Zaboronski,
    IEEE International Conference on Communications, pp. 1967–1971, 2008.

2007

  1. A review of the systems approach to the analysis of dynamic-mode atomic force microscopy,
    A. Sebastian, A. Gannepalli, M.V. Salapaka,
    IEEE Transactions on Control Systems Technolog, 15(5), 952–959, 2007.
  2. Control of MEMS-based scanning-probe data-storage devices,
    A. Pantazi, A. Sebastian, G. Cherubini, M. Lantz, H. Pozidis, H. Rothuizen, E. Eleftheriou,
    IEEE Transactions on Control Systems Technology 15(5), 824–841, 2007.
  3. Jitter investigation and performance evaluation of a small-scale probe storage device prototype,
    A. Sebastian, A. Pantazi, H. Pozidis,
    IEEE Global Telecommunications Conference GLOBECOM'07, pp. 288–293, 2007.

2006

  1. Scanning Probes Entering Data Storage: From Promise to Reality,
    H. Pozidis, P. Bachtold, J. Bonan, G. Cherubini, E. Eleftheriou, M. Despont, U. Drechsler, U. Durig, B. Gotsmann, W. Haberle, C. Hagleitner, D. Jubin, A. Knoll, M.A. Lantz, A. Pantazi, H.E. Rothuizen, A. Sebastian, R. Stutz, D.W. Wiesmann,
    IEEE Conference on Emerging Technologies – Nanoelectronics, pp. 39–44, 2006.
  2. Towards faster data access: Seek operations in MEMS-based storage devices,
    A. Sebastian, A. Pantazi, G. Cherubini, M. A. Lantz, H. Rothuizen, H. Pozidis, E. Eleftheriou,
    Proc. IEEE Conf. on Control Applications, pp. 283–288, 2006.
  3. An analog frontend chip for a MEMS-based parallel scanning-probe data-storage system,
    C. Hagleitner, T. Bonaccio, A. Pantazi, A. Sebastian, E. Eleftheriou,
    2006 Symposium on VLSI Circuits, Digest of Technical Papers, pp. 57–58, 2006.
  4. Dynamics of Silicon Micro-Heaters: Modelling and Experimental Identification,
    D. Wiesmann, A. Sebastian,
    19th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2006, pp. 182–185, 2006.

2005

  1. Two-sensor-based H∞ control for nanopositioning in probe storage,
    A. Pantazi, A. Sebastian, H. Pozidis, E. Eleftheriou,
    44th IEEE Conference on Decision and Control and 2005 European Control Conference CDC-ECC'05, pp. 1174–1179, 2005.
  2. Nanopositioning for probe storage,
    A. Sebastian, A. Pantazi, G. Cherubini, E. Eleftheriou, M. A. Lantz, H. Pozidis,
    Proc. IEEE American Control Conference, 2005, pp. 4181–4186.
  3. Signal processing for probe storage,
    H. Pozidis, P. Bachtold, G. Cherubini, E. Eleftheriou, C. Hagleitner, A. Pantazi, A. Sebastian,
    IEEE International Conference on Acoustics, Speech, and Signal Processing, pp. 745–748, 2005.
  4. Integrating nanotechnology into a working storage device,
    A. Knoll, P. Bachtold, J. Bonan, G. Cherubini, M. Despont, U. Drechsler, U. Durig, B. Gotsmann, W. Haberle, C. Hagleitner, D. Jubin, M. A. Lantz, A. Pantazi, H. Pozidis, H. Rothuizen, A. Sebastian, R. Stutz, P. Vettiger, D. Wiesmann, E. S. Eleftheriou,
    International Conference on Micro- and Nano-Engineering, pp. 1692–1697, Elsevier, 2005.

2004

  1. A servomechanism for a micro-electro-mechanical-system-based scanning-probe data storage device,
    A. Pantazi, M. A. Lantz, G. Cherubini, H. Pozidis, E. Eleftheriou,
    Nanotechnology 15(10), S612, IOP Publishing, 2004.
  2. Demonstration of thermomechanical recording at 641 Gbit/in2,
    H. Pozidis, W. Haberle, D. Wiesmann, U. Drechsler, M. Despont, T.R. Albrecht, E. Eleftheriou,
    IEEE Transactions on Magnetics 40(4), pp. 2531–2536, 2004.

2003

  1. Millipede—a MEMS-based Scanning-Probe Data-Storage System,
    E. Eleftheriou, T. Antonakopoulos, G. K. Binnig, G. Cherubini, M. Despont, A. Dholakia, U. Dürig, M. A. Lantz, H. Pozidis, H. E. Rothuizen, and P. Vettiger,
    IEEE Transactions on Magnetics 39(2), pp. 938–945, 2003.