IBM®
Skip to main content
    Country/region [change]    Terms of use
 
 
 
    Home    Products    Services & solutions    Support & downloads    My account    

IBM Systems Journal

Model-Driven Software Development   Volume 45, Number 3, 2006
Table of contents: HTMLPDF This article: HTMLPDF   Copyright info

A measurement framework for evaluating model-based test generation tools - Author Bios

by A. Sinha,
C. E. Williams,
and P. Santhanam
Biographical sketches of authors

Avik Sinha  IBM Thomas J. Watson Research Center, 19 Skyline Drive, 2NF07, Hawthorne, New York 10562 (avisinha@us.ibm.com). Dr. Sinha is a post-doctoral researcher at the Watson Research Center. He holds a B.Tech. degree from Indian Institute of Technology, Kharagpur, and M.S. and Ph.D. degrees from the University of Maryland at College Park. His areas of interest include software engineering, model-driven software development, software testing, and domain-specific test generation.

Clay E. Williams  IBM Thomas J. Watson Research Center, 19 Skyline Drive, 2NB04, Hawthorne, New York 10562 (clayw@us.ibm.com). Dr. Williams is a research staff member and manager of the Software Quality and Testing group. He has a Ph.D. in computer science from Texas A&M University. His areas of interest include software engineering, model-driven software development, software testing, and medical applications of information systems. He is a member of the IEEE and ACM.

P. Santhanam  IBM Thomas J. Watson Research Center, 19 Skyline Drive, GNB02, Hawthorne, New York 10562 (pasanth@us.ibm.com). Dr. Santhanam has a B.Sc. degree from the University of Madras, India, an M.Sc. degree from the Indian Institute of Technology, Madras, an M.A. degree from Hunter College of the City University of New York, and a Ph.D. from Yale University. He joined IBM Research in 1985, where he is currently Senior Manager in charge of the Software Engineering department, whose mission is to develop tools and methodologies in support of the software development process. He has authored more than 40 technical papers on a wide variety of topics in peer-reviewed journals and conference proceedings. Dr. Santhanam is a member of the ACM and a senior member of the IEEE.


    About IBMPrivacyContact