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IBM Systems Journal  
Volume 41, Number 1, 2002
Software Testing and Verification
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Improving software testing via ODC: Three case studies - Author bios

by M. Butcher, H. Munro, and T. Kratschmer

Biographical sketches of authors

Mark Butcher   IBM United Kingdom Laboratories, Hursley Park, Winchester, Hampshire, SO21 2JN, United Kingdom (electronic mail: Mark_Butcher@uk.ibm.com). Mr. Butcher is a senior software engineer at the IBM Hursley Development Laboratory. For nearly 16 years, he has worked on a number of large software projects including Graphical Data Display Manager (GDDM®), OS/2®, and MQSeries®, in a variety of test, development, and build roles. In addition, he is active in the ODC and Code Coverage process improvement activities at Hursley. He studied computer science at Thames Polytechnic (now Greenwich University), graduating in 1985.

Hilora Munro   IBM United Kingdom Laboratories, Hursley Park, Winchester, Hampshire, SO21 2JN, United Kingdom (electronic mail: hilora@uk.ibm.com). Ms. Munro has 20 years experience in the development of computer software, the last four being specifically within software testing. She received a B.Sc. degree in computer science from the University of Strathclyde, Scotland, and has subsequently been involved with a variety of software solutions and has worked in all areas of software development including design, development, test, and support. During the last few years, Ms. Munro has been actively involved in the drive to improve testing within the IBM test community. This has included the use of metrics, the deployment of ODC, and improving knowledge sharing within the test community.

Theresa Kratschmer   IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (electronic mail: theresak@us.ibm.com). Ms. Kratschmer is a software engineer with 16 years of experience developing software for real-time, graphics, and database applications. She has been with the Center for Software Engineering at IBM Research since 1996. Currently, she does research, deployment, and tool development related to defect analysis and testing technologies. She earned a B.S. degree from Cornell University in 1981 and an M.S. degree in advanced technology/computer science from the State University of New York at Binghamton in 1985.