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Please note: All papers are available in PDF format. A feature paper and abstracts are available in HTML. |
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Papers may be viewed by clicking on the title of interest |
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Preface
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H. K. Wickramasinghe and D. Rugar
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p. 602
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Physics and chemistry of materials
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Probing electrical transport, electron interference, and quantum size effects at surfaces with STM/STS
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Ph. Avouris, I.-W. Lyo, and Y. Hasegawa
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p. 603
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Force microscopy studies of the molecular origins of friction and lubrication
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C. M. Mate
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p. 617
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Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures
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M. A. Lutz, R. M. Feenstra, and J. O. Chu
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p. 629
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The use of STM to study metal film epitaxy
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D. D. Chambliss, R. J. Wilson, and S. Chiang
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p. 639
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New probe techniques
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Design and applications of a scanning SQUID microscope
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J. R. Kirtley, M. B. Ketchen, C. C. Tsuei, J. Z. Sun, W. J. Gallagher, Lock See Yu-Jahnes, A. Gupta, K. G. Stawiasz, and S. J. Wind
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p. 655
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The femtosecond field-emission camera, a device for continuous observation of the motion of individual adsorbed atoms and molecules
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G. M. McClelland, H. Heinzelmann, and F. Watanabe
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p. 669
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Storage applications
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High-density data storage using proximal probe techniques
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H. J. Mamin, B. D. Terris, L. S. Fan, S. Hoen, R. C. Barrett, and D. Rugar
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p. 681
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Some thoughts about scanning probe microscopy, micromechanics, and storage
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D. W. Pohl
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p. 701
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Recent publications by IBM authors
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p. 713
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Recent IBM patents
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p. 729
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Author index for Volume 39
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p. 739
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Subject index for Volume 39
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p. 745
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