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Proximal probe microscopies

Vol. 39, No. 6, 1995

Order No. G322-0200
The invention of the scanning tunneling microscope has provided impetus for the development of a broad range of new probe microscopies. The papers contained in this issue describe two of the new probe designs and review the application of these various imaging techniques to topics in the physics and chemistry of materials and in data storage.
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Please note: All papers are available in PDF format. A feature paper and abstracts are available in HTML.
Table of contents
Papers may be viewed by clicking on the title of interest
Preface H. K. Wickramasinghe and D. Rugar p. 602
Physics and chemistry of materials
Probing electrical transport, electron interference, and quantum size effects at surfaces with STM/STS Ph. Avouris, I.-W. Lyo, and Y. Hasegawa p. 603
Force microscopy studies of the molecular origins of friction and lubrication C. M. Mate p. 617
Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures M. A. Lutz, R. M. Feenstra, and J. O. Chu p. 629
The use of STM to study metal film epitaxy D. D. Chambliss, R. J. Wilson, and S. Chiang p. 639
New probe techniques
Feature paper Design and applications of a scanning SQUID microscope J. R. Kirtley, M. B. Ketchen, C. C. Tsuei, J. Z. Sun, W. J. Gallagher, Lock See Yu-Jahnes, A. Gupta, K. G. Stawiasz, and S. J. Wind p. 655
The femtosecond field-emission camera, a device for continuous observation of the motion of individual adsorbed atoms and molecules G. M. McClelland, H. Heinzelmann, and F. Watanabe p. 669
Storage applications
High-density data storage using proximal probe techniques H. J. Mamin, B. D. Terris, L. S. Fan, S. Hoen, R. C. Barrett, and D. Rugar p. 681
Some thoughts about scanning probe microscopy, micromechanics, and storage D. W. Pohl p. 701
Recent publications by IBM authors p. 713
Recent IBM patents p. 729
Author index for Volume 39 p. 739
Subject index for Volume 39 p. 745