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IBM Journal of Research and Development
Soft Errors in Circuits and Systems   Volume 52, Number 3, 2008
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SEMM-2: A new generation of single-event-effect modeling tools - References

 by H. H. K. Tang
References

  1. “Terrestrial Cosmic Rays and Soft Errors,” IBM J. Res. & Dev. 40, No. 1 (1996, entire issue).
  2. G. R. Srinivasan, H. H. K. Tang, and P. C. Murley, “Parameter-Free, Predictive Modeling of Single Event Upsets Due to Protons, Neutrons, and Pions in Terrestrial Cosmic Rays,” IEEE Trans. Nucl. Sci. 41, No. 6, 2063–2070 (1994).
  3. G. R. Srinivasan, P. C. Murley, and H. K. Tang, “Accurate, Predictive Modeling of Soft Error Rate Due to Cosmic Rays and Chip Alpha Radiation,” IEEE 32nd Annual Proceedings, Reliability Physics Symposium, 1994, pp. 12–16.
  4. P. C. Murley and G. R. Srinivasan, “Soft-Error Monte Carlo Modeling Program, SEMM,” IBM J. Res. & Dev. 40, No. 1, 109–118 (1996).
  5. H. H. K. Tang, “Nuclear Physics of Cosmic Ray Interaction with Semiconductor Materials: Particle-Induced Soft Errors from a Physicist's Perspective,” IBM J. Res. & Dev. 40, No. 1, 91–108 (1996).
  6. H. H. K. Tang, G. R. Srinivasan, and N. Azziz, “Cascade Statistical Model for Nucleon-Induced Reactions on Light Nuclei in the Energy Range 50 MeV–1 GeV,” Phys. Rev. C 42, No. 4, 1598–1622 (1990).
  7. N. Azziz, H. H. K. Tang, and G. R. Srinivasan, “A Microscopic Model of Energy Deposition in Silicon Slabs Exposed to High-Energy Protons,” J. Appl. Phys. 62, No. 2, 414–418 (1987).
  8. M. S. Gordon, K. P. Rodbell, D. F. Heidel, C. Cabral, Jr., E. H. Cannon, and D. D. Reinhardt, “Single-Event-Upset and Alpha-Particle Emission Rate Measurement Techniques,” IBM J. Res. & Dev. 52, No. 3, 265–273 (2008, this issue).
  9. H. H. K. Tang, C. E. Murray, G. Fiorenza, K. P. Rodbell, M. S. Gordon, and D. F. Heidel, “New Simulation Methodology for Effects of Radiation in Semiconductor Chip Structures,” IBM J. Res. & Dev. 52, No. 3, 245–253 (2008, this issue).
  10. D. F. Heidel, K. P. Rodbell, P. Oldiges, M. S. Gordon, H. H. K. Tang, E. H. Cannon, and C. Plettner, “Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells,” IEEE Trans. Nucl. Sci. 53, No. 6, 3512–3517 (2006).
  11. M. S. Gordon, P. Goldhagen, K. P. Rodbell, T. H. Zabel, H. H. K. Tang, J. M. Clem, and P. Bailey, “Measurement of the Flux and Energy Spectrum of Cosmic-Ray Induced Neutrons on the Ground,” IEEE Trans. Nucl. Sci. 51, No. 6, 3427–3434 (2004).
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  15. S. Gerardin, M. Bagatin, P. Rech, A. Cester, and A. Paccagnella, “Exploiting a Low-Energy Accelerator to Test Commercial Electronics with Low-LET Proton Beams,” paper presented at the RADECS 2006 Workshop, Athens, Greece, September 27–29, 2006.
  16. K. P. Rodbell, D. F. Heidel, H. H. K. Tang, M. S. Gordon, P. Oldiges, and C. E. Murray, “Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells,” IEEE Trans. Nucl. Sci. 54, No. 6, 2474–2479.
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  30. R. J. Peterson, G. J. Hofman, R. W. Pollock, and H. K. Tang, “Pion Production of Heavily Ionizing Particles from Aluminum,” Radiat. Measur. 35, No. 6, 565–569 (2002).
  31. H. H. K. Tang and K. P. Rodbell, “Single-Event Upsets in Microelectronics: Fundamental Physics and Issues,” Mat. Res. Soc. Bull. 28, No. 2, 111–116 (2003).
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