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IBM Journal of Research and Development

IBM System z9   Volume 51, Number 1/2, 2007
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IBM System z9 eFUSE applications and methodology - Author Bios

by R. F. Rizzolo,
T. G. Foote,
J. M. Crafts,
D. A. Grosch,
T. O. Leung,
D. J. Lund,
B. L. Mechtly,
B. J. Robbins,
T. J. Slegel,
M. J. Tremblay,
and G. A. Wiedemeier
Biographical sketches of authors

Richard F. Rizzolo IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (rizzolo@us.ibm.com). Mr. Rizzolo is a Senior Technical Staff Member and served as test team leader for several System z* projects, most recently for the System z9. He also has primary responsibility for the sort and characterization methodology for MCM chips designed in Poughkeepsie, New York. He received his B.S. degree in physics from Rensselaer Polytechnic Institute in 1977 and his M.E. degree in electrical engineering from Rensselaer in 1980. Since joining IBM in 1978, Mr. Rizzolo has worked on bipolar and CMOS projects in the areas of design for testability, high-frequency design and timing analysis, diagnostics, and circuit design. He holds ten patents and has co-authored a number of papers in the field of testability and diagnostics.

Thomas G. Foote IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (tomfoote@us.ibm.com). Mr. Foote is a Senior Engineer and test data development team leader for zSeries chips. He received his B.S.E.E. degree from Purdue University in 1973, joining IBM that same year in the area of chip test data development for early FET chip designs. Mr. Foote has worked in test tool development, functional simulation, packaging tools, large systems competitive analysis, and most recently in chip test data development. He holds patents and has co-authored papers in the area of design and design for test.

James M. Crafts IBM Systems and Technology Group, 1000 River Street, Essex Junction, Vermont 05452 (jcrafts@us.ibm.com). Mr. Crafts is a Senior Engineer in the World Wide Test Engineering Group. He joined IBM in 1985.

David A. Grosch IBM Systems and Technology Group, 1000 River Street, Essex Junction, Vermont 05452 (grosch@us.ibm.com). Mr. Grosch received a B.S. degree in electrical engineering from the Rochester Institute of Technology in 1985, joining IBM that same year, He is currently an Advisory Engineer working on zSeries burn-in development.

Tak O. Leung IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (tleung@us.ibm.com). Mr. Leung is a Senior Engineer and the MCM manufacturing test leader for zSeries MCMs. He received his B.S.E.E. degree from Columbia University in 1983, joining IBM that same year in the area of chip design-for-test for vendor components and continuing to work in the field of test development for both large-system MCM designs and vendor MCM designs, with a focus in manufacturing. Most recently Mr. Leung held program management responsibilities for the MCM manufacturing of the bond, assembly, and test operations for several OEM customers. He has co-authored papers in the area of design and design for test.

David J. Lund IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (dlund@us.ibm.com). Mr. Lund received an M.S. degree in computer science from Union College in 1985. In 1987, he joined IBM at the Poughkeepsie, New York, Development Laboratory to work on the System/390* Processor Controller. He is currently a Senior Software Engineer, working on the zSeries service element. He has received several IBM Outstanding Technical Achievement Awards for his work on System/390 and zSeries hardware reset applications.

Bryan L. Mechtly IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (mechtly@us.ibm.com). Mr. Mechtly received a B.S. degree in computer science from Indiana University of Pennsylvania in 1983. After graduation he joined IBM in the Processor Controller Department in Poughkeepsie, New York, working on bipolar mainframe computers. Mr. Mechtly supported the transition to CMOS mainframe technology and currently works in the service element area. He has received several IBM Outstanding Technical Achievement Awards for his work on the processor controller and service element; he is a coauthor of one U.S. patent and several patent applications.

Bryan J. Robbins IBM Systems and Technology Group, 3790 Mesquite Drive, Beavercreek, Ohio 45440 (brobbins@us.ibm.com). Mr. Robbins is a Senior Engineer at IBM. He received a B.S. degree in electrical engineering in 1986 and an M.S. degree in computer and electrical engineering in 1988, both from Purdue University. Mr. Robbins has co-authored several papers in the area of design for test; he holds eight patents.

Timothy J. Slegel IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (slegel@us.ibm.com). Mr. Slegel received his B.S.E.E. and M.S.E.E. degrees from Lehigh University in 1980 and 1982, respectively, joining IBM in 1982. He has worked in many areas of processor design, including floating-point units, vector processors, and cache design. He was the chief architect and overall team leader for the G5 and z990 microprocessors, and the overall technical leader for the processor subsystem in the System z9. Mr. Slegel has received two IBM Corporate Awards, three IBM Outstanding Innovation Awards, two IBM Outstanding Technical Achievement Awards, and a Tenth-Plateau IBM Invention Achievement Award, with 38 U.S. patents. He is a Distinguished Engineer, currently working on the design of future IBM systems.

Michael J. Tremblay IBM Systems and Technology Group, 2455 South Road, Poughkeepsie, New York 12601 (MJT307@us.ibm.com). Mr. Tremblay received B.S. and M.S. degrees in electrical engineering from the University of New Hampshire. He also received an M.B.A. degree in finance and accounting from Marist College. He was employed as a Senior Engineer by G.T.E. before joining IBM at the Poughkeepsie, New York, Development Laboratory to work on the 3080X System Processor Controller. Mr. Tremblay was a key test team member for the H2 MCMs, the first modules to incorporate self-test. He was the system architect for the SST MCM testers designed and built by IBM. Mr. Tremblay has received an IBM Outstanding Technical Achievement Award for his work on the H2 MCM self-test design. He has presented papers at the Manufacturing Technology Symposium and the Test ITL.

Glen A. Wiedemeier IBM Systems and Technology Group, 11400 Burnet Road, Austin, Texas 78758 (wiedem@us.ibm.com). Mr. Wiedemeier is a Staff Engineer; he has served as an I/O designer for POWER4+*, POWER5*, POWER5+*, and z9 systems. He received his B.S. degree in engineering from the University of Wisconsin at Madison in 2001. He joined IBM that same year and has since designed high-speed single-ended and differential amplifiers, laser fuse sense circuits, and eFUSE sense circuits.

*Trademark, service mark, or registered trademark of International Business Machines Corporation in the United States, other countries, or both.


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