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IBM Journal of Research and Development

Advanced Silicon Technology   Volume 50, Number 4/5, 2006
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High-performance CMOS variability in the 65-nm regime and beyond  - References

by K. Bernstein,
D. J. Frank,
A. E. Gattiker,
W. Haensch,
B. L. Ji,
S. R. Nassif,
E. J. Nowak,
D. J. Pearson,
and N. J. Rohrer
References

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