|
|
 |
|
 |
Volume 45, Number 1, 2001
Organic electronics |
|
Table of contents: HTML PDF ASCII |
|
This article: HTML PDF ASCII |
Copyright info |
 |
 |
 |
 |
| |
|
STM-excited electroluminescence and spectroscopy on organic materials for display applications - References and note
|
 |
by S. F. Alvarado, L. Rossi, P. Müller, P. F. Seidler, and W. Riess |
 |
 |
 |
References and note
-
W. Schottky, Z. Phys. 118, 539 (1942); see also W. Mönch, Surf. Sci. 132, 92 (1983).
-
K. Sugiyama, D. Yoshimura, T. Miyamae, T. Miyazaki, H. Ishii, Y. Ouchi, and K. Seki, J. Appl. Phys. 83, 4928 (1998); H. Ishii and K. Seki, IEEE Trans. Electron Devices 44, 1295 (1997); K. Seki, E. Ito, and I. Ishii, Synth. Met. 91, 137 (1997).
-
A. Rajagopal, C. I. Wu, and A. Kahn, J. Appl. Phys. 83, 2649 (1998); I. G. Hill, A. Rajagopal, A. Kahn, and Y. Hu, Appl. Phys. Lett. 73, 662 (1998).
-
S. T. Lee, X. Y. Hou, M. G. Mason, and C. W. Tang, Appl. Phys. Lett. 72, 1593 (1998).
-
T. Mori, H. Fujikawa, S. Tokito, and Y. Taga, Appl. Phys. Lett. 73, 2763 (1998).
-
R. Schlaf, B. A. Parkinson, P. A. Lee, K. W. Nebesny, and A. R. Armstrong, J. Phys. Chem. B 103, 2984 (1999).
-
S. C. Veenstra, U. Stalmach, V. V. Krasnikov, G. Hadziioannou, H. T. Jonkman, A. Heres, and G. Sawatsky, Appl. Phys. Lett. 76, 2253 (2000).
-
I. H. Campbell, T. W. Hagler, D. L. Smith, and J. P. Ferraris, Phys. Rev. Lett. 76, 1900 (1996).
-
G. L. J. A. Rikken, Y. A. R. R. Kessener, D. Braun, E. G. J. Staring, and A. Demandt, Synth. Met. 67, 115 (1994).
-
S. F. Alvarado, L. Libioulle, and P. F. Seidler, Synth. Met. 91, 69 (1997).
-
S. F. Alvarado, W. Riess, and P. F. Seidler, Phys. Rev. B 56, 1269 (1997).
-
(a) S. F. Alvarado, P. F. Seidler, D. G. Lidzey, and D. D. C. Bradley, Phys. Rev. Lett. 81, 1082 (1998); (b) L. Rossi, S. F. Alvarado, W. Riess, S. Schrader, D. G. Lidzey, and D. D. C. Bradley, Synth. Met. 111112, 527 (2000).
-
R. N. Marks, J. J. M. Halls, D. D. C. Bradley, R. H. Friend, and A. B. Holmes, J. Phys. Cond. Mater. 6, 1379 (1994).
-
S. Barth, S. Deussen, and H. Bässler, Phil. Trans. Roy. Soc. Lond. A 355, 749 (1997); S. Barth and H. Bässler, Phys. Rev. Lett. 79, 4445 (1997).
-
E. L. Frankevich, A. A. Lymarev, I. Sokolik, F. F. Karacz, S. Blumenstengel, R. H. Baughman, and H. H. Hörhold, Phys. Rev. B 46, 9320 (1992).
-
M. Scheidler, U. Lemmer, R. Kerstin, S. Karg, W. Riess, B. Cleve, R. F. Mart, H. Kurz, H. Bässler, E. O. Göbel, and P. Thomas, Phys. Rev. B 54, 5536 (1996).
-
C. H. Lee, G. Yu, D. Moses, and A. J. Heeger, Phys. Rev. B 49, 2396 (1994).
-
J. M. Leng, S. Jeglinski, X. Wei, R. E. Benner, Z. Vardeny, F. Guo, and S. Mazumdar, Phys. Rev. Lett. 72, 156 (1994).
-
M. Chandross, S. Mazumdar, S. Jeglinski, X. Wei, Z. V. Vardeny, E. W. Kwock, and T. M. Miller, Phys. Rev. B 50, 14702 (1994).
-
S. A. Van Slyke, C. H. Chen, and C. W. Tang, Appl. Phys. Lett. 69, 2160 (1996).
-
S. A. Van Slyke and C. W. Tang, U.S. Patent 4,720,432, 1988; C. Adachi, K. Nagai, and N. Tamoto, Appl. Phys. Lett. 66, 2679 (1995).
-
C. W. Tang and S. A. Van Slyke, Appl. Phys. Lett. 51, 913 (1987); C. W. Tang, S. A. Van Slyke, and C. H. Chen, J. Appl. Phys. 65, 3610 (1989).
-
See for example R. Feenstra, Phys. Rev. B 50, 4561 (1994); C. Julian Chen, Introduction to Scanning Tunneling Microscopy, Oxford Series in Optical and Imaging Sciences, M. Lapp, J.-I. Nishizawa, B. B. Snavely, H. Stark, A. C. Tam, and T. Wilson, Eds., Oxford University Press, New York, 1993; R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Methods and Applications, Cambridge University Press, Cambridge, England, 1994.
-
E. M. Conwell and E. W. Wu, Appl. Phys. Lett. 70, 1867 (1997).
-
M. N. Bussac, D. Michoud, and L. Zuppiroli, Phys. Rev. Lett. 81, 1678 (1998).
-
M. A. Lampert and P. Mark, Current Injection in Solids, H. G. Booker and N. DeClaris, Eds., Academic Press, Inc., New York, 1970.
-
See for instance A. van der Ziel, in Solid State Physical Electronics, W. L. Everitt, Ed., Prentice-Hall, Inc., Englewood Cliffs, NJ, 1968.
-
The phenomenon of tip penetration as a function of tunneling voltage has been reported previously for organic materials. To our knowledge, however, no attempt has been made to determine electronic levels from those measurements; see for instance F. G. C. Hogenraad, A. C. R. Hogervorst, P. M. L. O. Scholte, and F. Tunistra, Ultramicrosc. 4244, 1004 (1992); W. Mizutani, M. Shigeno, Y. Sakakibara, K. Kajimura, M. Ono, S. Tanishima, K. Ohno, and N. Toshima, J. Vac. Sci. Technol. A 8, 675 (1990).
-
M. Brinkmann, G. Gadret, M. Muccini, C. Taliani, N. Masciocchi, and A. Sironi, J. Amer. Chem. Soc. 122, 5147 (2000).
-
H. B. Michaelson, J. Appl. Phys. 48, 4729 (1977).
-
C. Hosokawa, H. Higashi, H. Nakamura, and T. Kusumoto, Appl. Phys. Lett. 67, 3853 (1995).
-
M. Matsumura and T. Akai, Jpn. J. Appl. Phys. 35, 5357 (1996).
-
M. Probst and R. Haight, Appl. Phys. Lett. 71, 202 (1997).
-
A. Schmidt, M. L. Anderson, and N. R. Armstrong, J. Appl. Phys. 78, 5619 (1995).
-
S. T. Lee, Y. M. Wang, X. Y. Hou, and C. W. Tang, Appl. Phys. Lett. 74, 670 (1999).
-
E. M. Conwell, Synth. Met. 83, 101 (1996).
-
A. Curioni, M. Boero, and W. Andreoni, Chem. Phys. Lett. 294, 263 (1998).
-
P. E. Burrows, Z. Shen, V. Buloic, D. M. McCarty, S. Forrest, J. A. Cronin, and M. E. Thompson, J. Appl. Phys. 79, 7991 (1996).
-
H. Riel, Diplomarbeit, Institut für Technische Physik I, Friedrich-Alexander Universität, Erlangen-Nürenburg, Germany, April 1998.
-
L. Rossi, P. Müller, S. F. Alvarado, and W. Riess, Proceedings of E-MRS, Strasbourg, France, May 30 June 2, 2000 (to be published in Synthetic Metals).
-
G. Parthasarathy, P. E. Burrouws, V. Kalfin, V. G. Kozlov, and S. R. Forrest, Appl. Phys. Lett. 72, 2138 (1998).
-
P. M. Borsenberger and D. S. Weiss, Organic Photo Receptors for Imaging Systems, Marcel Dekker, Inc., New York, 1993, and references therein.
-
R. G. Kepler, P. M. Beeson, S. J. Jacobs, R. A. Anderson, M. B. Sinclair, V. S. Valencia, and P. A. Cahill, Appl. Phys. Lett. 66, 3618 (1995); T. Tsutsui, H. Tokuhisa, and M. Era, Proc. SPIE 3281, 230 (1998).
-
A. G. Mückl, S. Berleb, W. Brütting, and M. Schwoerer, Synth. Met. 111112, 91 (2000).
-
I. I. Smolyaninov and M. S. Khaikin, Phys. Lett. A 149, 410 (1990); I. I. Smolyaninov, Surf. Sci. 364, 135 (1996).
-
E. Flaxer, O. Sneh, and O. Chesnovski, Science 262, 2012 (1993).
-
D. G. Lidzey, S. F. Alvarado, P. F. Seidler, A. Bleyer, and D. D. C. Bradley, Appl. Phys. Lett. 71, 2008 (1997).
-
D. G. Lidzey, D. D. C. Bradley, S. F. Alvarado, and P. F. Seidler, Nature 386, 135 (1997).
-
J. V. Barth, H. Burne, G. Ertl, and R. J. Behm, Phys. Rev. B 42, 9307 (1990).
-
R. Berndt and J. K. Gimzewski, Phys. Rev. Lett. 67, 3796 (1991), and references therein.
-
Y. Sato, S. Ichinosawa, and H. Kanai, in Inorganic and Organic Electroluminescence, R. H. Mauch and H.-L. Gummlich, Eds., Wissenschaft und Technik, Berlin, 1996, p. 225.
|
 |
|
|