Biographical sketch of author
Bernard S. Meyerson
IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (meyerson@us.ibm.com).
Dr. Meyerson received the Ph.D. degree in physics from the City College of the City University of New York in 1981, subsequently joining the IBM Thomas J. Watson Research Center as a Research Staff Member. Dr. Meyerson's early work in the field of electronic materials focused on the science underlying the practice of low-temperature silicon epitaxy, the growth of atomically precise single-crystal layers of silicon required for ultrahigh-performance devices and circuits. He invented the ultrahigh vacuum/chemical vapor deposition (UHV/CVD) technique, a method which greatly expanded the range of single-crystal materials and alloys which could be prepared in the silicon and silicon:germanium materials system. Exploitation of these new materials set a series of world records in the fields of electronic device performance and fundamental semiconducting material properties. Dr. Meyerson has received several major awards for this body of work: the Young Authors Award from the American Association of Crystal Growth, the Materials Research Society Medal, and the Electrochemical Society's Electronics Division Award. In 1992, Dr. Meyerson received IBM's highest technical honor, appointment by the Chairman as an IBM Fellow. In February 1998 Dr. Meyerson was honored as Inventor of the Year by the New York State Senate, and he was among six finalists for the 1997 Inventor of the Year for the United States. He was also elected a Fellow of the American Physical Society in 1998 and received the IEEE Ernst Weber Engineering Leadership Recognition in 1999. In June 1999 he received the Distinguished Inventor Award given by the Intellectual Property Owners Association. Dr. Meyerson is now IBM's Director of Telecommunication Technologies.
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