Biographical sketches of authors
Peilin Song
IBM System/390 Division, 522 South Road, Poughkeepsie, New York 12601 (psong@us.ibm.com).
Dr. Song received the M.S. and Ph.D. degrees in electrical engineering from the University of Rhode Island in 1994 and 1997, respectively. He joined the IBM S/390 Division in 1997 as a member of the Custom Microprocessor Design Department. His current interests are in the area of design for test, diagnostics, modeling, and circuit simulation. Dr. Song has more than ten publications in the area of test generation, fault modeling, and diagnostics. He is a member of the IEEE and serves on the program committee of the IEEE North Atlantic Test Workshop.
Franco Motika
Micrus/IBM Corporation, East Fishkill facility, Route 52, Hopewell Junction, New York 12533 (motika@us.ibm.com).
Mr. Motika is currently a Senior Technical Staff Member in the area of VLSI test and diagnostics. He joined the IBM General Technology Division in 1968 in an advanced semiconductor memory characterization group and has since been involved with custom VLSI design and logic test. During this time Mr. Motika's assignments have included the architecture, software and hardware development, design, and implementation of various VLSI test systems, and the development of diverse test and diagnostic methodologies. He has received an IBM Corporate Outstanding Technical Innovation Award (1988), an Outstanding Innovation Award (1986) for the weighted random-pattern test concept, a GTD Achievement Award and a GTD Division Award (1983) for contributions to logic final test, four Outstanding Technical Achievement Awards for test throughput and product SPQL enhancements, and the Micrus CEO Recognition Award. He has also received several Invention Achievement Awards for various patents and innovations. Mr. Motika received a B.S. degree in 1968 and an M.S. degree in 1969, both in electrical engineering, from the Polytechnic Institute of Brooklyn, New York. He is a Senior Member of the Computer Society of the Institute of Electrical and Electronics Engineers.
Daniel R. Knebel
IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (knebeld@us.ibm.com).
Mr. Knebel is a Senior Engineer in the Advanced Systems Technology Department at the IBM Thomas J. Watson Research Center. He joined the IBM Data Systems Division in 1982, working on circuit families for high-performance processors. He has since worked in a variety of related areas, including VLSI verification, reliability, and diagnostics, electronic design automation, and microprocessor design. Mr. Knebel is currently part of a research team developing diagnostic analysis techniques for integrated circuit processes and products. He received a B.S. degree in electrical engineering from Purdue University in 1982 and has received four Technical and Invention Achievement Awards since joining IBM.
Richard F. Rizzolo
IBM System/390 Division, 522 South Road, Poughkeepsie, New York 12601 (rizzolo@us.ibm.com).
Mr. Rizzolo is a Senior Engineer and served as test team leader for the S/390 G4 and G5 projects. He also had primary responsibility for sorting for S/390 chips designed in Poughkeepsie. He received his B.S. degree in physics from Rensselaer Polytechnic Institute in 1977 and his M.E. degree in electrical engineering from Rensselaer in 1980. Since joining IBM in 1978, Mr. Rizzolo has worked on bipolar and CMOS projects in the areas of design for testability, high-frequency design and timing analysis, diagnostics, and circuit design. In 1994 Mr. Rizzolo was assigned to Boeblingen, Germany, to develop CMOS timing methodology. He is a member of the IEEE and holds three patents and several published inventions. Mr. Rizzolo is a co-author of several papers in the field of testability and diagnostics; he has received three Outstanding Technical Achievement Awards and two Outstanding Innovation Awards.
Mary P. Kusko
IBM Server Group, 1580 Route 52, Hopewell Junction, New York 12533 (eleve@us.ibm.com).
Ms. Kusko is a Senior Engineer in EDA at IBM East Fishkill, where she has worked as a consultant in test strategy definition and implementation. Earlier, she worked in S/390 processor design in the area of design verification and test. She received her B.S. degree in electrical engineering from the University of Delaware. Ms. Kusko is a member of the IEEE and the SWE, and serves on the ITC program committee. She has several publications and four patents pending.
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