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by
M. Mueller, L. C. Alves, W. Fischer, M. L. Fair, and I. Modi |
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References
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M. L. Kerbaugh, CMOS Quality Report—Year End 1998, IBM Microelectronics Division, Essex Junction, VT 05452, February 24, 1999.
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T. J. O'Gorman, J. M. Ross, A. H. Taber, J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, and J. L. Walsh, “Field Testing for Cosmic Ray Soft Errors in Semiconductor Memories,” IBM J. Res. Develop. 40, No. 1, 4150 (1996).
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T. Buechner, R. Fritz, P. Guenther, M. Helms, K. D. Lamb, M. Loew, T. Schlipf, and M. H. Walz, “Event Monitoring in Highly Complex Hardware Systems,” IBM J. Res. Develop. 43, No. 5/6, (1999, this issue).
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L. F. Spainhower and T. A. Gregg, “G4: A Fault-Tolerant CMOS Mainframe,” presented at the Twenty-Eighth Annual International Symposium on Fault-Tolerant Computing, Munich, Germany, June 2325, 1998.
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M. A. Check and T. J. Slegel, “Custom S/390 G5 and G6 Microprocessors,” IBM J. Res. Develop. 43, No. 5/6, (1999, this issue).
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