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IBM Journal of Research and Development  
Volume 42, Number 5, 1998
Electrochemical Microfabrication
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Damascene copper electroplating for chip interconnections - Author bios

by P. C. Andricacos, C. Uzoh, J. O. Dukovic, J. Horkans, and H. Deligianni

Biographical sketches of authors

Panos C. Andricacos IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598 (ndricac@us.ibm.com). Dr. Andricacos is Manager of the Electrodeposition Technology group at the IBM Thomas J. Watson Research Center. He received B.S., M.S., and doctoral degrees in chemical engineering from Columbia University, where he is also an adjunct associate professor. As a postdoctoral research associate at the Lawrence Berkeley Laboratories, he worked on fuel cells and on the application of UHV techniques in the study of electrochemical reactions. While at IBM, he has worked on the application of electrochemical processes in storage, packaging, and C4 technology; he also played a key role in the development of copper electroplating for chip metallization. In 1993 he received the Research Award of the Electrodeposition Division, Electrochemical Society, for the development of novel techniques for the study of alloy electroplating.

Cyprian Uzoh IBM Microelectronics Division, East Fishkill facility, Route 52, Hopewell Junction, New York 12533 (uzoh@us.ibm.com). Mr. Uzoh is an Advisory Engineer/Scientist at the IBM Semiconductor Research and Development Center (SRDC). He received his B.S. degree in metallurgical engineering from the University of Wisconsin at Madison and his M.S. degree in materials engineering from Rensselaer Polytechnic Institute. In 1985, he joined IBM at the Thomas J. Watson Research Center, where he developed processes for fabricating X-ray lithography mask membranes. For the last ten years he has been involved in research on thin-film interfaces, high-performance barriers, development of a low-cost metallization process for high-performance chip interconnects, thin-film reliability, process integration, and equipment design.

John O. Dukovic IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (dukovic@us.ibm.com). Dr. Dukovic received a B.S. in chemical engineering from Case Western Reserve University in 1980 and a Ph.D. in chemical engineering from the University of California at Berkeley in 1986. Since joining IBM in 1986, he has worked primarily on mathematical models, reactor design, tool engineering, and process control, in support of electrodeposition processes for magnetic recording heads, packaging modules, flip-chip interconnections, and copper chip wiring. He has been an Adjunct Assistant Professor of Chemical Engineering and Applied Chemistry at Columbia University. Dr. Dukovic is currently Manager of Silicon Processing and Operations in the Advanced Semiconductor Technology Laboratory at the Thomas J. Watson Research Center. He is chairman of the Electrodeposition Division of the Electrochemical Society.

Jean Horkans IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (horkan@us.ibm.com). Dr. Horkans is a Research Staff Member at the IBM Thomas J. Watson Research Center working in the field of microelectronics manufacturing research. Her main interests are electrochemistry and electrodeposition. She joined IBM at the Watson Research Center in 1973 after having received a B.A. in chemistry from St. Olaf College and a Ph.D. in chemistry from Case Western Reserve University. She received an IBM Outstanding Technical Achievement Award in 1982 for development of electrochemical monitors and a Research Division Award in 1991 for contributions to magnetic disks. Dr. Horkans is a member of the Electrochemical Society and the New York Academy of Sciences.

Hariklia Deligianni IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598 (lili@us.ibm.com). Dr. Deligianni is an Advisory Engineer at the IBM Thomas J. Watson Research Center. She received a Ph.D. degree in chemical engineering from the University of Illinois at Urbana-Champaign in 1988. She was hired at IBM Research that same year and worked as a Postdoctoral Fellow on the electrodeposition mechanism of magnetic materials. Since 1990, she has worked on C4 and Cu interconnections both at IBM Research and at the East Fishkill Semiconductor Research and Development Center. Dr. Deligianni's interests include electrodeposition of metals, mathematical modeling of semiconductor processes, and process integration. She has co-authored about 20 publications and four patents.