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Journal of Research and Development  
Volume 40, Number 1, 1996
Terrestrial cosmic rays and soft errors
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Soft-error Monte Carlo modeling program, SEMM

by P. C. Murley and G. R. Srinivasan
The application of a computer program, SEMM (Soft-Error Monte Carlo Modeling), is described. SEMM calculates the soft-error rate (SER) of semiconductor chips due to ionizing radiation. Used primarily to determine whether chip designs meet SER specifications, the program requires detailed layout and process information and circuit Qcrit values.