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	<title>IBM Technical Journals | IBM Journal of Research and Development</title> 
	<link>http://www.research.ibm.com/journal/rd/</link> 
	<description>Notification of new IBM JRD issues</description> 
	<language>en-us</language> 
	<pubDate>Fri, 17 Mar 2006 16:00:00 EST</pubDate> 
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		<title>IBM</title> 
		<url>http://www.ibm.com/i/v14/t/ibm-logo.gif</url> 
		<link>http://www.research.ibm.com/journal/</link> 
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		<title>Vol. 53, No. 4, 2009 - Internet and Enterprise-Scale Data Centers</title> 
		<link>http://www.research.ibm.com/journal/rd53-4.html</link> 
		<description> 
		Topics for this diverse issue on Internet and enterprise-scale data centers include cloud computing, the use of virtualization for disaster recovery, virtual appliances, and a range of technologies relating to data center service, provisioning, control, reconfiguration, and security. 
		</description> 
		<pubDate>Wed, 10 Aug 2009 15:15:00 EDT</pubDate> 
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		<title>Special report: Celebrating 50 years of the IBM Journals</title> 
		<link>http://www.research.ibm.com/journal/50th/</link> 
		<description>Since the first publication of the IBM Journal of Research and Development in 1957 and the IBM Systems Journal in 1962, these Journals have provided descriptions and chronicles of many important advances in information technology and related topics ranging from atoms to business solutions. To celebrate the 50th anniversary of the IBM Journals, this report highlights a selection of significant papers published in the Journals, along with brief commentaries. The Journal editors chose papers which were very highly cited in the technical literature, described technologies of historic significance, or provided an important overview of a field.
		</description> 
		<pubDate>Wed, 31 Jan 2007 14:00:00 EST</pubDate> 
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		<title>Vol. 53, No. 2, 2009 - Harmonizing Security and Privacy </title> 
		<link>http://www.research.ibm.com/journal/rd53-2.html</link> 
		<description>Security measures to prevent terrorist attacks and other threats must be balanced against the possible loss of privacy that arises when personal information is collected in support of such measures. This issue of the journal contains eight papers that focus on various aspects of the challenge of harmonizing security and privacy requirements. These include the analysis of privacy and security policies, privacy regulations in various countries, and a policy framework for security and privacy management. The issue also contains a non-topical paper that deals with fine-grained recovery in enterprise storage controllers. 
		</description> 
		<pubDate>Wed, 11 Mar 2009 15:15:00 EDT</pubDate> 
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		<title>Vol. 53, No. 3, 2009 - Environmental Monitoring and Management</title> 
		<link>http://www.research.ibm.com/journal/rd53-3.html</link> 
		<description>Information technology plays critical roles in helping address environmental challenges.  Topics for this diverse issue include the emergence of a new computing paradigm based on sensing and modeling, business management strategies and dashboards, carbon and emissions management, optimization of datacenter energy utilization, and applications relating to the optimization and monitoring of rivers, water pumps, and railroads. A non-topical paper describes a technique for simulating wrinkling of thin films on patterned substrates.    
		</description> 
		<pubDate>Mon, 11 May 2009 15:15:00 EDT</pubDate> 
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		<title>Vol. 53, No. 1, 2009 - IBM z10 System</title> 
		<link>http://www.research.ibm.com/journal/rd53-1.html</link> 
		<description>The IBM System z10 Enterprise Class server is a powerful mainframe system offering increased power efficiency, improved price/performance ratio, and expanded range of business solutions. It delivers high scalability for growth and large-scale consolidation, high availability to reduce risk and improve flexibility, and enhanced security. The 17 papers in this issue describe the design, testing, and verification of the z10 microprocessor, the I/O subsystem, and the packaging design of the central electronic complex. System software and performance are described in papers dealing with reliability, availability, and serviceability, autonomic capability and active resource monitoring, capacity-on-demand advancements, and performance improvements derived through novel software and hardware synergy.
		</description> 
		<pubDate>Wed, 4 Feb 2009 15:15:00 EDT</pubDate> 
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		<title>Vol. 52, No. 6, 2008 - 3D Chip Technology</title> 
		<link>http://www.research.ibm.com/journal/rd52-6.html</link> 
		<description>Historically, the steady growth of computer system performance depended on the performance of microprocessors, which depended on the scaling of devices and circuits to smaller dimensions. As scaling on the 2D surface of chips approaches practical limits, 3D technologies offer an opportunity for continued system improvements, even as the progress of scaling slows down. The eight papers in this issue describe the system design opportunities and challenges of 3D chip technology, as well as methods for producing dense arrays of through-silicon vias, thinned silicon, dense area-array silicon-silicon interconnection, chip stacking, and 3D wafer integration. Thermomechanical modeling and the implementation of 3D structures in products are also described.
		</description> 
		<pubDate>Fri, 24 Oct 2008 19:00:00 EDT</pubDate> 
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		<title>Vol. 52, No. 4/5, 2008 - Storage Technologies and Systems</title> 
		<link>http://www.research.ibm.com/journal/rd52-45.html</link> 
		<description>Technology shifts and market forces are changing the composition and design of storage systems. Topics for this diverse issue include the emergence of nonvolatile storage technologies, virtualization technologies that reduce the distinction between storage and computing platforms, advances in tape densities, the growing use of commodity and distributed storage, and the increasing importance of error and disaster recovery, autonomic storage management, petascale file and archival storage, and long-term data preservation.
		</description> 
		<pubDate>Tue, 3 Jun 2008 19:00:00 EDT</pubDate> 
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		<title>Vol. 52, No. 3, 2008 - Soft Errors in Circuits and Systems</title> 
		<link>http://www.research.ibm.com/journal/rd52-3.html</link> 
		<description>Radiation can cause transistors to change their state and induce soft errors in computers. As transistor density and performance of CMOS (complementary metal-oxide semiconductor) devices increase, the reduced transistor size and low-power operation of the devices require that greater emphasis be placed on the understanding and control of soft errors in devices, circuits, and final system applications. The nine papers in this issue highlight the current understanding of the soft error rate (SER) in CMOS devices, circuits, and servers. The role of alpha-particles (helium nuclei), mitigation strategies, physics-based nuclear models, device design, treatment of experimental data, and strategies for reducing SERs in complex servers are described and reviewed.
		</description> 
		<pubDate>Wed, 27 Feb 2008 01:45:00 EST</pubDate> 
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