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	<title>IBM Technical Journals | IBM Journal of Research and Development</title> 
	<link>http://www.research.ibm.com/journal/rd/</link> 
	<description>Notification of new IBM JRD issues</description> 
	<language>en-us</language> 
	<pubDate>Fri, 17 Mar 2006 16:00:00 EST</pubDate> 
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		<title>IBM</title> 
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		<link>http://www.research.ibm.com/journal/</link> 
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		<title>Special report: Celebrating 50 years of the IBM Journals</title> 
		<link>http://www.research.ibm.com/journal/50th/</link> 
		<description>Since the first publication of the IBM Journal of Research and Development in 1957 and the IBM Systems Journal in 1962, these Journals have provided descriptions and chronicles of many important advances in information technology and related topics ranging from atoms to business solutions. To celebrate the 50th anniversary of the IBM Journals, this report highlights a selection of significant papers published in the Journals, along with brief commentaries. The Journal editors chose papers which were very highly cited in the technical literature, described technologies of historic significance, or provided an important overview of a field.
		</description> 
		<pubDate>Wed, 31 Jan 2007 14:00:00 EST</pubDate> 
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		<title>Vol. 52, No. 3, 2008 - Soft Errors in Circuits and Systems</title> 
		<link>http://www.research.ibm.com/journal/rd52-3.html</link> 
		<description>Radiation can cause transistors to change their state and induce soft errors in computers. As transistor density and performance of CMOS (complementary metal-oxide semiconductor) devices increase, the reduced transistor size and low-power operation of the devices require that greater emphasis be placed on the understanding and control of soft errors in devices, circuits, and final system applications. The nine papers in this issue highlight the current understanding of the soft error rate (SER) in CMOS devices, circuits, and servers. The role of alpha-particles (helium nuclei), mitigation strategies, physics-based nuclear models, device design, treatment of experimental data, and strategies for reducing SERs in complex servers are described and reviewed.
		</description> 
		<pubDate>Wed, 27 Feb 2008 01:45:00 EST</pubDate> 
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		<title>Vol. 52, No. 1/2, 2008 - Applications of Massively Parallel Systems</title> 
		<link>http://www.research.ibm.com/journal/rd52-12.html</link> 
		<description>New approaches to applications, tools for parallelization, and architectures exemplified by the Blue Gene/L system have allowed massively parallel systems to address an increasingly broad range of applications.  Topics for this diverse issue include molecular dynamics, geophysical imaging, drug discovery, quantum chromodynamics, nuclear fusion, neuron modeling, climate simulation, turbulence, and an introduction to the new Blue Gene/P architecture.
		</description> 
		<pubDate>Wed, 5 Dec 2007 01:45:00 EST</pubDate> 
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		<title>Vol. 51, No. 6, 2007 - IBM POWER6 Microprocessor Technology</title> 
		<link>http://www.research.ibm.com/journal/rd51-6.html</link> 
		<description>The dual-core POWER6 microprocessor has double the speed of the previous-generation POWER5 microprocessor without increasing the energy required for its operation. It is currently the world's fastest processor chip.  The topics described in the nine papers in this issue include chip architecture, performance accelerators, chip and circuit design, power and heat management, enhanced virtualization, and reliability.
		</description> 
		<pubDate>Fri, 12 Oct 2007 01:45:00 EST</pubDate> 
	</item> 
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		<title>Vol. 51, No. 5, 2007 - Cell Broadband Engine Technology and Systems</title> 
		<link>http://www.research.ibm.com/journal/rd51-5.html</link> 
		<description>The Cell Broadband Engine (or Cell/B.E.) is a revolutionary extension of conventional processor organization that provides power-efficient and cost-effective high-performance processing for a wide range of applications. This issue includes eight papers that provide descriptions of the Cell/B.E. Architecture, advanced security schemes, design and implementation of the Cell/B.E. using 90-nm and 65-nm CMOS silicon-on-insulator (SOI) processes, computational examples illustrating enhanced performance, Cell/B.E. blade server technology and applications, speech recognition, and software to automatically exploit the superscalar nature of the Cell/B.E. A nontopical review paper on polymer self assembly is also included.
		</description> 
		<pubDate>Wed, 8 Aug 2007 02:45:00 EST</pubDate> 
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