Project Overview
As propagated signal transitions become comparable to propagation
delays, high speed on-chip and packaging interconnect design now
requires that the transmission line properties of an increasing number
of critical wires be analyzed carefully before committing the designed
system to production. Signal timing and integrity will be greatly
compromised if the chip and system design ignores the inductive,
lossy, and dispersive nature of the interconnect network.
The analysis of such networks at both the chip and system level
imposes stringent requirements on the circuit simulator in terms of
architecture, accuracy, and performance. Lossy, dispersive
transmission lines are distributed systems that are better described
in the frequency domain yet their nonlinear drivers and loads are
better analyzed and simulated, as lumped systems, in the time domain.
The aim of this project is to augment and extend the current
capabilities of IBM's circuit simulator, PowerSpice, in the simulation
of transmission lines. We are currently investigating and extending
novel macromodeling techniques based on the transfer matrix of the
muticonductor system that includes the modeling of the
frequency-dependent behavior of the system's inductive impedance and
dielectric loss. The main feature of these techniques is that they do
not require the costly time-domain convolutions typically used by
circuit simulators to simulate transmission lines. An R & D
macromodeling prototype has been coded and run on industrial examples,
proving the feasibility of the novel algorithms and confirming their
accuracy and efficiency.
This prototype along with the expertise developed during the research
phase will soon be incorporated in IBM's PowerSpice using its device
API to provide it with an on-the-fly capability for the fast, accurate
macromodeling of lossy, dispersive transmission lines.
University partners:
Carleton University
Reference:
Elfadel, I.M., H. Huang, A. E. Ruehli, A. Dounavis, and M. S. Nakhla, "A comparative Study of Two Transient Analysis Algorithms for Lossy Transmission Lines with Frequency-Dependent Data," to appear in the Proceeding of the Electrical Performance of Electronic Packaging Conference, Boston, MA, October 2001.
For further information contact:
Abe Elfadel <elfadel@us.ibm.com>